For Customers and Partners

The DGZfP Expert Committees for Acoustic Emission Testing Methods and Condition Monitoring cordially invite you to the SCHALL 25 event. You can look forward to numerous presentations, exciting workshops and professional dialogue.

»Innovations for Our Future« – unter diesem Motto präsentiert sich die Fraunhofer-Gesellschaft auf der Hannover Messe 2025. Mehr als 13 Fraunhofer-Institute, -Verbünde und -Allianzen stellen vom 31. März bis 4. April 2025 auf dem Fraunhofer-Stand ihre Exponate aus drei Themen vor: AI for Industrial Innovation, Energy Solutions and Circular Economy, Smart Systems and Materials Efficiency.

Under the slogan Innovations for our Future, eight Fraunhofer institutes will present their current research developments at the Fraunhofer joint stands in Hall 2.2, Booth D-109. Visit us at our booth and talk to our research colleagues on site. See you in Berlin!

The 8th UKP Workshop Ultrafast Laser Technology will focus on processes and systems that can help companies capitalize on the full range of laser performance, such as high speed scanning or suitable beam shaping. Interesting presentations will provide valuable know-how about selecting the right laser source or individually modifying the laser beam profile in time and space in order to have optimal process conditions. Furthermore, experts will discuss how to push the boundaries of today’s ultrafast laser process engineering.

Nanotechnology is a core technology utilized in numerous sectors. At the 5th Symposium on Nanotechnology of the Fraunhofer Nanotechnology Network, with the support of the Federal Institute for Risk Assessment (BfR), will once again address the opportunities and risks associated with this rapidly evolving field. The two-day event at the Fraunhofer Institute for Silicate Research ISC in Würzburg will address a range of topics related to the application of nanotechnology in various sectors, including digitalization, 2D/3D printing, carbon-based materials and battery materials.

The VDE ITG MN 5.6 group cordially invites experts and newcomers to the field of semiconductor reliability to the 17th VDE ITG MN 5.6 symposium “f(ast)WLR, Wafer Level Reliability, Reliability Simulation & Qualification” at the Fraunhofer IKTS in Dresden – this year with the focus topic: “Chiplets & their usage in fWLR methodology”.