Construction and characterization of a measurement system for tomography using ultrashort terahertz pulses.
Anika Brahm, M. Eng. (Fraunhofer Institute for Applied Optics and Precision Engineering IOF)
Terahertz radiation’s interesting properties make it a promising technology for analyzing the properties of materials and components. The rays penetrate a wide variety of substances and allow the non-destructive analysis of interior structures. Until now, it has not been possible to conduct a materials analysis with simultaneous localization in the test object.
As part of her Master’s thesis, Brahm designed a terahertz measurement system capable of measuring transmission and reflection simultaneously. This makes it possible for the first time to spatially assign complete spectral information to create a three-dimensional spectral tomography. With this new procedure, specialists anticipate significantly broader application potential for terahertz systems in quality control and safety engineering.